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81380004: Electron microscopy study, scanning, with X-ray analysis, examination and report (procedure)


Status: current, Necessary but not sufficient concept definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core

Descriptions:

Id Description Lang Type Status Case? Module Reference Sets
134999018 Electron microscopy study, scanning, with X-ray analysis, examination and report en Synonym (core metadata concept) Active Only initial character case insensitive (core metadata concept) SNOMED CT core GB English: Preferred (foundation metadata concept)
822644014 Electron microscopy study, scanning, with X-ray analysis, examination and report (procedure) en Fully specified name Active Only initial character case insensitive (core metadata concept) SNOMED CT core GB English: Preferred (foundation metadata concept)

0 descendants.

Expanded Value Set


Outbound Relationships Type Target Active Characteristic Refinability Group Values
Electron microscopy study, scanning, with X-ray analysis, examination and report Is a Scanning electron microscopy study true Inferred relationship Some
Electron microscopy study, scanning, with X-ray analysis, examination and report Has intent Diagnostic intent (qualifier value) false Inferred relationship Some
Electron microscopy study, scanning, with X-ray analysis, examination and report Method Microscopy - action false Inferred relationship Some
Electron microscopy study, scanning, with X-ray analysis, examination and report Method Investigation - action false Inferred relationship Some
Electron microscopy study, scanning, with X-ray analysis, examination and report Component Sample observable false Inferred relationship Some
Electron microscopy study, scanning, with X-ray analysis, examination and report Direct device Microscope false Inferred relationship Some
Electron microscopy study, scanning, with X-ray analysis, examination and report Method Inspection - action false Inferred relationship Some 1
Electron microscopy study, scanning, with X-ray analysis, examination and report Using Microscope false Inferred relationship Some 1
Electron microscopy study, scanning, with X-ray analysis, examination and report Using device (attribute) Microscope false Inferred relationship Some 1
Electron microscopy study, scanning, with X-ray analysis, examination and report Using device (attribute) Microscope true Inferred relationship Some 1
Electron microscopy study, scanning, with X-ray analysis, examination and report Method Inspection - action true Inferred relationship Some 1

Inbound Relationships Type Active Source Characteristic Refinability Group

This concept is not in any reference sets

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